IS 11425 : 1985/IEC 333 : 1983 Test procedures for semiconductor charged particle detectors
| UDC 621.317.39.539.1.074.55.539.12 : 620.1 | LTD 8 |
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| Reaffirmed 2020 |
National Foreword
This Indian Standard which is identical with IEC Pub 333 : 1983`Test procedures for semiconductor charged-particle detectors',issued by the International Electrotechnical Commission (IEC) Wasadopted by the Indian Standards Institution on the recommendationof the Nuclear Instrumentation Sectional Committee and approval ofthe Electronics and Telecommunication Division Council.
Cross References
| International Standard | Corresponding Indian Standard |
| IEC 50-391 : 1975 | IS 1885 : Part 63 : 1985 Electrotechnical vocabulary: Part 63 Nuclear instrumentation |
| IEC 340 : 1979 | IS 11645 : 1985 Test procedures for amplifiers and preamplifiers for semiconductor detectors for ionizing radiation |