IS 11534 : Part 1 : 1985 Specification for directly heated positive step function temperature co-efficient thermistors: Part 1 General requirements and methods of tests
UDC 621.316.825 : 621.1 | LTD 5 |
|
Reaffirmed 2021 |
1 Scope
1.1 This standard (Part 1) is applicable to direct heatedpositive temperature coefficient thermistors, insulated ornon-insulated, having a resistance temperature characteristic whichapproximates to a step-function. Typically they are made offerro-electric semi-conductive materials.
2 References
IS 8186 :1976Marking codes for values andtolerances of resistors and capacitors
IS 9000 : Part 1 :1977Basic environmental testing proceduresfor electronic and electrical items :Part 1 General
IS 9000 : Part 2 : Sec 4 :1977 Basic environmental testingproceduresfor electronic and electrical items : Part 2 Cold test,Section 4 Cold test for heatdissipating items with gradual changeof temperature
IS 9000 : Part 3 : Sec 5 :1977 Part 3 Dry heat test,Section 5 Dry heat test for heatdissipating items with gradual changeof temperature
IS 9000 : Part 4 :1979Basic environmental testing proceduresfor electronic and electrical items:Part 4 Damp heat (steady state)
IS 9000 : Part 5 : Sec 1 :1981 Part 5 Damp heat (cyclic) test,Section 16 + 8 cyclic
IS 9000 : Part 8 :1981Basic environmental testing proceduresfor electronic and electrical items:Part 8 Vibration (sinusoidal) test
IS 9000 : Part 13 :1981Part 13 Low air pressure test
IS 9000 : Part 14 : Sec 1 :1978 Basic environmental testing proceduresfor electronic and electrical items :Part 14 Change of temperature,Section 1 Solderability of wireand tag terminations
IS 9000 : Part 18 : Sec 2 : 1981 Basic environmentaltesting proceduresfor electronic and electrical items: Part 18 Solderability test,Section 2 Resistance of items tosoldering heat
IS 9000 : Part 18 : Sec 1 : 1981 Basic environmentaltesting proceduresfor electronic and electrical items:Part 18 Solderability test,Section 1 Solderability of wire and tag terminations
IS 9000 : Part 19 : 1978 Basicenvironmental testing proceduresfor electronic and electrical items:Part 19 Test for robustness ofterminations and integral mountingdevices,
Section 1 Tensile test;
Section 3 Bending test; and
Section 4 Torsion test