IS 12737 : 1988 /IEC Pub 759 : 1983 Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
| UDC 621.384.8 | LTD 8 |
|
| Reaffirmed 2020 |
National Foreword
This Indian Standard, which is identical with IEC Pub 759 (1983)`Standard test procedures for semiconductor X-ray energyspectrometers' issued by the International ElectrotechnicalCommission (IEC), was adopted by the Bureau of Indian Standards on21 September 1988 on the recommendation of the NuclearInstrumentation Sectional Committee (LTDC 26) and approval of theElectronics and Telecommunication Division Council.
Cross References
| International Standard | Corresponding Indian Standard |
| IEC Pub50 | IS 1885 : Part 63 : 1985Electrotechnicalvocabulary: Part 63 Nuclear instrumentation |
| IEC Pub333 | IS 11425 : 1985 Test procedure forsemiconductorcharged - particle detectors |
| IEC Pub 340 | IS11645 : 1985 Test procedures for amplifiersand preamplifier for semiconductor detectors forionizing radiation |
| IEC Pub656 | IS 12639 : 1988 Test procedures forhigh-puritygermanium detectors for X and gamma radiation |