IS 12970 : Part 3 : Sec 1 : 1992 Semiconductor devices - Integrated circuits: Part 3 Digital integrated circuits - Measuring methods, Sec 1 General
| UDC 621.3.049.77.037.37 : 621.317.3 | LTD 5 |
|
| Reaffirmed 2018 |
1 SCOPE
This standard ( Part 3/Sec 1 ) provides general information on measuring methods of digital integrated circuits.