IS 12970 : Part 3 : Sec 3 : 1993 Semiconductor devices - Integrated circuits: Part 3 Digital integrated circuits - Measuring methods, Sec 3 Dynamic measurements

1 SCOPE

This standard ( Part 3/Sec 3 ) covers the dynamic measurements for Digital Integrated Circuits.

2 REFERENCES

1885 ( Part 7/Sec 5 ) : 1971 Electrotechnical vocabulary: Part 7 Semiconductor devices, Section 5 Integrated circuits and microelectronics

3715 (Part 1 ) : 1971 Letter symbols for semiconductor devices: Part 1 General

12970 ( Part 1 ) : 1990 Semiconductor devices - Integrated circuits: Part 1 General