IS 14700 : Part 4 : Sec 33 : 2018/IEC 61000-4-33 : 2005 Electromagnetic compatibility ( EMC ) Part 4 Testing and Measurement Techniques Section 33 Measurement methods for high-power transient parameters

ICS 33.100.10; 33.100.20

LITD 09

Reaffirmed 2021

NATIONAL FOREWORD

This Indian Standard (Part 4/Sec 33) which is identical with IEC 61000-4-33 : 2005 ‘Electromagnetic compatibility (EMC) - Part 4-33 : Testing and measurement techniques - Measurement methods for high-power transient parameters’ issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on recommendation of the Electromagnetic Compatibility Sectional Committee and approval of the Electronics and Information Technology Division Council.

The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain terminologies and conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should be read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker, while in Indian Standards, the current practice is to use a point (.) as the decimal marker.