IS 14700 : Part 4 : Sec 34 : 2017/IEC 61000-4-34 : 2009 Electromagnetic Compatibility (EMC) Part 4 Testing and Measurement Techniques Section 34 Voltage Dips, Short Interruptions and Voltage Variations Immunity Tests for Current More than 16 A Per Phase
Reaffirmed 2023
NATIONAL FOREWORD
This Indian Standard (Part 4/Sec 34) which is identical with IEC 61000-4-34 : 2009 ‘Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with mains current more than 16 A per phase’ issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the Electromagnetic Compatibility Sectional Committee and approval of the Electronics and Information Technology Division Council.
The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions and terminologies are however not identical to those used in Indian Standards. Attention is particularly drawn to the following:
a) Wherever the words International Standard appear referring to this standard, they should be read as Indian Standard.
b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.