IS 15038 : 2011/IEC 61164 : 2004 : Reliability Growth - Statistical Test and Estimation Methods

NATIONAL FOREWORD

This Indian Standard (First Revision) which is identical with IEC 61164 : 2004 'Reliability growth - Statistical test and estimation methods' issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council.

The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words 'International Standard' appear referring to this standard, they should be read as 'Indian Standard'.

b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.