IS 15444 : Part 1 : 2012/IEC 61163-1 : 2006 : Reliability Stress Screening - Part 1 : Repairable Assemblies Manufactured in Lots

NATIONAL FOREWORD

This Indian Standard (Part 1) (First Revision) which is identical with IEC 61163-1 : 2006 ‘Reliability stress screening - Part 1: Repairable assemblies manufactured in lots’ issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council.

This standard was originally published in 2004 which was identical with IEC 61163-1 : 1995. The first revision of this standard has been undertaken to align it with the latest version of IEC 61163-1 : 2006.

The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should be read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.