ICS 03.120.01; 31.020                         LITD 02

[ Superseding IS 9186 : 1979 ]

Reaffirmed 2023

NATIONAL FOREWORD

This Indian Standard (Part 2) (First Revision) which is identical with IEC 61163-2 : 2020 Reliability stress screening — Part 2: Components’ which is under preparation by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on recommendation of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council.

This standard was first published in 2005 and was based on IEC 61163-2 : 1998. The first revision of this standard has been undertaken to align it with the latest version of IEC 61163-2 : 2020. On publication this Standard IS 9186 : 1979 stands cancelled.

The text of ISO Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain terminologies and conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should be read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker, while in Indian Standards, the current practice is to use a point (.) as the decimal marker.