IS 16410 : 2017 / ISO/TS 10798 : 2011 Nanotechnologies — Characterization of Single-Wall Carbon Nanotubes Using Scanning Electron Microscopy and Energy Dispersive X-Ray Spectrometry Analysis

ICS 01.040.07; 07.030                          MTD 33

Reaffirmed 2022

NATIONAL FOREWORD

This Indian Standard which is identical with ISO/TS 10798 : 2011 Nanotechnologies — Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive x-ray spectrometry analysis’ issued by the International Organization for Standardization (ISO) was adopted by the Bureau of Indian Standards on the recommendation of the Nanotechnologies Sectional Committee and approval of the Metallurgical Engineering Division Council.

The committee has now decided to adopt this standard under dual numbering system and make it align with ISO/TS 10798.

The text of ISO Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain terminology and conventions are however not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear, referring to this standard, they should be read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.