IS 17182 : 2020 X-ray Diffraction Based Residual Stress Measurements

New Standard from Last Update.

1 SCOPE

This standard prescribes the procedure to be followed for measuring residual stresses present on surfaces of polycrystalline metallic components by using X-ray diffraction (XRD) technique. This procedure is intended for use along with the procedures mentioned in manuals provided by the manufacturers of X-ray diffraction systems.