IS 17210 : Part 1 : 2019/IEC TS 62804-1 : 2015 Photovoltaic (PV) Modules - Test Methods for the Detection of Potential-Induced Degradation Part 1 Crystalline Silicon

ICS 27.160

ETD 28

New Standard from Last Update.

NATIONAL FOREWORD

This Indian Standard (Part 1) which is identical with IEC TS 62804-1 : 2015 ‘Photovoltaic (PV) modules — Test methods for the detection of potential-induced degradation — Part 1: Crystalline silicon’ issued by the International Electrotechnical Commission(IEC) was adopted by the Bureau of Indian Standards on recommendation of the Solar Photovoltaic Energy Systems Sectional Committee and approval of the Electrotechnical Division Council.

The text of IEC standard has been approved as suitable for publication as an Indian Standard without deviations.

Certain terminologies and conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words International Standard appear referring to this standard, they should be read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker, while in Indian Standards, the current practice is to use a point (.) as the decimal marker.