IS 8644 : 2001 Strip-Wound Cut Cores of Grain Oriented Silicon-Iron Alloy, Used for Electronic and Telecommunication Equipment
| ICS 29.100.10; 29.180 | LITD 24 |
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| Reaffirmed 2020 |
National Foreword
This Indian Standard which is identical with IEC 329 : 1985`Strip-wound cut cores of grain oriented silicon-iron alloy, usedfor electronic and telecommunication equipment' issued by theInternational Electrotechnical Commission (IEC) was adopted by theBureau of Indian Standards on the recommendation of MagneticComponents and Ferrite Materials Sectional Committee and approvalof the Electronics and Telecommunication Division Council.
Cross References
| International Standard | Corresponding Indian Standard |
| IEC 68-1 : 1982 | IS 9000 : Part 1 : 1988 Basic environmental testing procedures for electronic and electrical items: Part 1 General |
| IS 9001 : Part 1 : 1984 Guidance for environmental testing: Part 1 General |
| IEC 68-2-14 : 1984 | IS 9000 : Part 14 : Sec 1 to 3 : 1988 Basic Environmental testing procedures for electronic and electrical items: Part 14 Change of temperature |