IS 8690 : 1977 Application guide for measuring devices for high voltage testing

1 Scope

This guide gives information on measuring systems and devicesother than sphere gaps, used for the measurement of high voltagesof currents during the performance of dielectric test in accordancewith IS 2071 : Part III : 1976. In general, use of the devices andof the measuring and calibration procedures described herein willsatisfy the specified requirements for accuracy, but their use isnot mandatory, other devices and procedures may be used if they areshown to have equal accuracy.

1.1.1 Voltage measurements with sphere gaps are dealt with in IS1876 : 1961.

2 References

IS 2 :1960Rules of rounding numerical values

IS 1876 :1961Method for voltage measurement by means ofsphere-gaps

IS 2071 : Part II :1974 Methods of high voltage testing:Part II Test procedures

IS 2071 : Part III :1976 Methods of high testing:Part III Measuring devices

IS 3156 : Part II :1965 Specification for Voltagetransformers:Part II Measuring voltage transformers