IS/IEC 60512 : Part 2 : Sec 1 : 2002 Connectors for Electronic Equipment - Part 2 Tests and Measurements - Section 1 Electrical Continuity and Contact Resistance Tests - Test 2a: Contact Resistance Millivolt Level Method

ICS 31.220.10

LITD 03

NATIONAL FOREWORD

This Indian Standard which is identical to IEC 60512-2-1 : 2002 'Connectors for electronic equipment - Tests and measurements - Part 2: Electrical continuity and contact resistance tests, Section 1 Test 2a contact resistance - Millivolt level method' issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the Electromechanical Components and Mechanical Structures for Electronic Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council.

The other parts in this series are:

Part 1 Generic specification

Part 2 Electrical continuity and contact resistance tests

Part 3 Insulation test

Part 4 Voltage stress tests

The text of IEC standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions are however not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words 'International Standard' appears referring to this standard, they should be read as 'Indian Standard'; and

b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.