IS/IEC 60512 : Part 4 : Sec 3 : 2002 Connectors for Electronic Equipment - Part 4 Tests and Measurements - Section 3 Voltage Stress Tests - Test 4c Voltage Proof of Pre-insulated Crimp Barrels
NATIONAL FOREWORD
This Indian Standard (Part 4/Sec 3) which is identical to IEC 60512-4-3 : 2002 'Connectors for electronic equipment - Part 4: Tests and measurements, Section 3 Voltage stress tests - Test 4c Voltage proof of pre-insulated crimp barrels' issued by International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the Electromechanical Components and Mechanical Structures for Electronic Equipment Sectional Committee (LITD 03) and approval of the Electronics and Information Technology Division Council.
The other parts in this series are:
Part 1: Generic specification
Part 2: Electrical continuity and contact resistance tests
Part 3: Insulation test
Part 4: Voltage stress tests
The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions are however not identical to those used in Indian Standards. Attention is particularly drawn to the following:
a) Wherever the words 'International Standard' appears referring to this standard, they should be read as 'Indian Standard'; and
b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.