[ Superseding IS 8161 (Part 7) : 2012 ]

Reaffirmed 2022

NATIONAL FOREWORD

This Indian Standard which is identical with IEC 61124 : 2012 ‘Reliability testing — Compliance tests for constant failure rate and constant failure intensity’ issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on recommendation of the Reliability of Electronic and Electrical Components and Equipment Sectional Committee and approval of the Electronics and Information Technology Division Council.

IS 8161 (Part 7) was first published in 1977 and was subsequently revised in 2012. First revision of IS 8161 (Part 7) was identical with IEC 61124 : 2006. The suspending of above-mentioned standard has been undertaken to align it with the latest version of IEC 61124 : 2012 and on publication of this standard, IS 8161 (Part 7) : 2012 is withdrawn.

The text of IEC Standard has been approved as suitable for publication as an Indian Standard without deviations. Certain terminologies and conventions are, however, not identical to those used in Indian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they should be read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker, while in Indian Standards, the current practice is to use a point (.) as the decimal marker.