IS/IEC 62506 : 2013 Product Accelerated Testing - Methods

NATIONAL FOREWORD

This Indian Standard which is identical to IEC 62506 : 2013 'Methods for product accelerated testing' issued by the International Electrotechnical Commission (IEC) was adopted by the Bureau of Indian Standards on the recommendation of the dependability of Electronic, Electrical Components, Equipment and Systems Sectional Committee and approval of the Electronics and Information Technology Division Council.

The text of IEC standard has been approved as suitable for publication as an Indian Standard without deviations. Certain conventions are however not identical to those used in Indian Standards. Attention is particularly drawn to the following:

 a) Wherever the words 'International Standard' appears referring to this standard, they should be read as 'Indian Standard'; and

 b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practice is to use a point (.) as the decimal marker.